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Super-resolution method for CT slice interval under various imaging conditions

2023.01.17Publications

CT scan images can be categorized into two types: thin slice images with slice intervals are about less than 1 mm, and thick slice images with large slice intervals. Although thick slice images are frequently used for long term storage to reduce the data size, they do not have sufficient resolution for diagnosis (Figure 1). Therefore, this paper [1] proposed a method to generate thin slice images from thick slice images using a generative adversarial learning (GAN)-based algorithm. To overcome the lack of generated pattern variety, authors feed slice condition including body part information with degraded parameter scales into the discriminator (Figure 2). Experimental results showed that the proposed method obtains the best scores by objective image quality degradation tests and a subjective visible test (PSNR/SSIM metrics (Table 1) and Visual Turing Test (Figure 3)). In the future, it is expected that this method will be used as preprocessing for image recognition tasks that are difficult to process with thick slice images, and that comparative diagnosis between latest thin slice images and stored thick slice images.

Figure 1. CT images of thin slice and thick slice.
Figure 2. Proposed training framework. [1] (Input slice condition including body part information with degraded parameter scales into the discriminator.)
Table 1. PSNR and SSIM comparison result in experiments. [based on [1]]
PSNR: Peak Signal to Noise Ratio
SSIM: Structual SIMilarity
(PSNR and SSIM are widely used methods to evaluate objective image quality degradation.)
Figure 3. The generated images of each method and the answered ratio in the Visual Turing Test. [based on [1]]

[1] Kudo, A., Kitamura, Y., Li, Y., Iizuka, S., Simo-Serra, E. (2019). Virtual Thin Slice: 3D Conditional GAN-based Super-Resolution for CT Slice Interval. In: Knoll, F., Maier, A., Rueckert, D., Ye, J. (eds) Machine Learning for Medical Image Reconstruction. MLMIR 2019. Lecture Notes in Computer Science(), vol 11905. Springer, Cham. 

DOI: https://doi.org/10.1007/978-3-030-33843-5_9 


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